【專利讓與及授權】教育部計畫產出專利公告(2件)

項次

技術名稱

專利證書號

摘要

專利期

1

光學薄膜缺陷辨識方法及其系統

I603074

本發明揭露一種光學薄膜缺陷辨識方法及其系統，其包含由光學感測器檢測光學薄膜之影像，經由亮度均化、增強對比度、濾除雜訊、影像平滑化及二值化處理等步驟後轉換成乾淨偵測影像。乾淨偵測影像中像素點與周圍像素點之空間相對關係，轉換成空間關係序列樣型，與不同類型之缺陷特徵序列樣型比較後，辨識光學薄膜之缺陷為點缺陷、缺料缺陷或是波紋缺陷。

2017/10/21-2035/07/02

2

OPTICAL FILM DEFECT DETECTION METHOD AND SYSYTEM THEREOF

US 9,582,872 B2

An optical defect detection method and a system thereof are disclosed. The detection method includes a process of detecting an image of an optical film by an optical detector. The image is converted into a clean detection image by conducting the following processes: uniforming the brightness, enhancing the contrast, filtering off the noise, smoothing the image and binarizing the image. A relative relation between a pixel and the surrounding pixels of the clean detection image is converted into a spatial relation sequence model. The spatial relation sequence model is compared to the different types of the defect sequence model, so that the defect type of the optical film is identified as a point defect, a lack of material defect or a ripple defect.

2017/02/28-2035/12/11